ㅇ 논문 제목: A Real-Time, Operator-Centric Patch Extraction and Analysis Platform for Industrial Semiconductor Wafer C&C Processes
ㅇ Author: Giseop Noh (노기섭 교수님)
ㅇ DOI: 10.1109/ACCESS.2025.3638806
ㅇ Date of Publication: 28 November 2025
ㅇ Electronic ISSN: 2169-3536