[SCIE] 논문 출판 (IEEE Access)

작성자: shark | 작성일: 2025-12-03 14:56 | 수정됨: 2025-12-03 14:56 | 조회수: 64
공지글

ㅇ 논문 제목: A Real-Time, Operator-Centric Patch Extraction and Analysis Platform for Industrial Semiconductor Wafer C&C Processes

ㅇ Author: Giseop Noh (노기섭 교수님)

ㅇ DOI: 10.1109/ACCESS.2025.3638806

ㅇ Date of Publication: 28 November 2025

ㅇ Electronic ISSN: 2169-3536

ㅇ 논문 링크: https://ieeexplore.ieee.org/document/11271507


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