ㅇ 논문 제목: A Real-Time, Operator-Centric Patch Extraction and Analysis Platform for Industrial Semiconductor Wafer C&C Processes ㅇ Author: Giseop Noh (노기섭 교수님) ㅇ DOI: 10.1109/ACCESS.2025.3638806 ㅇ Date of Publication: 28 November 2025 ㅇ Electronic ISSN: 2169-3536 ㅇ 논문 링크: https://ieeexplore.ieee.org/document/11271507